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Near-field optical imaging of metallic nanoparticles, holes and slitsAIGOUY, L; SAMSON, B; MORTIER, M et al.Proceedings of SPIE. 2005, pp 59280H.1-59280H.9, isbn 0-8194-5933-X, 1VolConference Paper

Multiplexed nanoscopic imagingYAKOVLEV, V. V; LUK'YANCHUK, B.Laser physics. 2004, Vol 14, Num 8, pp 1065-1071, issn 1054-660X, 7 p.Article

Theoretical analysis and property study of optical focus detection based on differential confocal microscopyJIUBIN TAN; FUSHENG WANG.Measurement science & technology (Print). 2002, Vol 13, Num 8, pp 1289-1293, issn 0957-0233, 5 p.Article

Selected papers on near-field opticsJUTAMULIA, Suganda.SPIE milestone series. 2002, Num 172, issn 1050-0529, 540 p.Serial Issue

Inspection of nano-sized SNOM-tips by optical far-field evaluationSEEBACHER, S; OSTEN, W; VEIKO, V. P et al.Optics and lasers in engineering. 2001, Vol 36, Num 5, pp 451-473, issn 0143-8166Article

Shear force distance control in near-field optical microscopy : experimental evidence of the frictional probe-sample interactionLAPSHIN, D. A; KOBYLKIN, E. E; LETOKHOV, V. S et al.Ultramicroscopy. 2000, Vol 83, Num 1-2, pp 17-23, issn 0304-3991Article

Microscopie en champ proche optique en vue de la spectroscopie de molécules individuelles = Near-field optical microscopy for single molecule spectroscopyViellerobe, Bertrand; Orrit, Michel.2000, 187 p.Thesis

Nanostructured probes for scanning near-field optical microscopyDREWS, D; EHRFELD, W; LACHER, M et al.Nanotechnology (Bristol. Print). 1999, Vol 10, Num 1, pp 61-64, issn 0957-4484Conference Paper

Silicon-micromachined scanning confocal optical microscopeDICKENSHEETS, D. L; KINO, G. S.Journal of microelectromechanical systems. 1998, Vol 7, Num 1, pp 38-47, issn 1057-7157Article

Sub-wavelength imaging by depolarization in a reflection near-field optical microscope using an uncoated fiber probeMADSEN, S; BOZHEVOLNYI, S. I; HVAM, J. M et al.Optics communications. 1998, Vol 146, Num 1-6, pp 277-284, issn 0030-4018Article

ETUDE DE SPECTROSCOPIE ET MICROSCOPIE OPTIQUES EN CHAMP PROCHE : APPLICATION AUX STRUCTURES REALISEES PAR NANOFABRICATION = Scanning near-field optical microscopy and spectroscopy : Application to the structures realized by nanofabricationEssaïdi, Noureddine; Launois, Auguette.1998, 165 p.Thesis

A compact near-field scanning optical microscopeMERRITT, G; MONSON, E; BETZIG, E et al.Ultramicroscopy. 1998, Vol 71, Num 1-4, pp 183-189, issn 0304-3991Conference Paper

Determination of the shear force magnitude in near-field scanning optical microscopyWEI, P. K; FANN, W. S.Ultramicroscopy. 1998, Vol 71, Num 1-4, pp 159-163, issn 0304-3991Conference Paper

Control of aperture size of optical probes for scanning near-field optical microscopy using focused ion beam technologyMURANISHI, M; SATO, K; HOSAKA, S et al.Japanese journal of applied physics. 1997, Vol 36, Num 7B, pp L942-L944, issn 0021-4922, 2Article

Near-field scanning optical microscope using a gold particleOKAMOTO, T; YAMAGUCHI, I.Japanese journal of applied physics. 1997, Vol 36, Num 2A, pp L166-L169, issn 0021-4922, 2Article

A macroscopic approach to near-field optical microscopyWANG, S; XIAO, M; SIQUEIROS, J et al.Journal of modern optics (Print). 1996, Vol 43, Num 10, pp 2119-2127, issn 0950-0340Article

Thermal simulation analysis of scanning near-field optical microscope point heating mechanismsMIYAMOTO, M; SHINTANI, T; HOSAKA, S et al.Japanese journal of applied physics. 1996, Vol 35, Num 5A, pp L584-L586, issn 0021-4922, 2Article

A theoretical model for the Inverse Scanning Tunneling Optical Microscope (ISTOM)VAN LABEKE, D; BAIDA, F; BARCHIESI, D et al.Optics communications. 1995, Vol 114, Num 5-6, pp 470-480, issn 0030-4018Article

Super-resolution imaging and detection of fluorescence from single molecules by scanning near-field optical microscopy : Optics in Switzerland. II: Universities and research institutesMEIXNER, A. J; ZEISEL, D; BOPP, M. A et al.Optical engineering (Bellingham. Print). 1995, Vol 34, Num 8, pp 2324-2332, issn 0091-3286Article

Near-field scanning optical microscope with a laser trapped probeKAWATA, S; INOUYE, Y; SUGIURA, T et al.Japanese journal of applied physics. 1994, Vol 33, Num 12A, pp L1725-L1727, issn 0021-4922, 2Article

New analytical approximations for negative feedback currents with a microdisk SECM tipCORNUT, R; LEFROU, C.Journal of electroanalytical chemistry (1992). 2007, Vol 604, Num 2, pp 91-100, issn 1572-6657, 10 p.Article

Apparent hardening of soft samples through Q factor change in AFMDUBOURG, F; AIME, J. P; COUTURIER, G et al.Europhysics letters (Print). 2003, Vol 62, Num 5, pp 671-676, issn 0295-5075, 6 p.Article

Looking at the nanoscale: scanning near-field optical microscopyDE SERIO, M; ZENOBI, R; DECKERT, V et al.TrAC. Trends in analytical chemistry (Regular ed.). 2003, Vol 22, Num 2, pp 70-77, issn 0165-9936, 8 p.Article

Near-field photonics: surface plasmon polaritons and localized surface plasmonsZAYATS, Anatoly V; SMOLYANINOV, Igor I.Journal of optics. A, Pure and applied optics (Print). 2003, Vol 5, Num 4, pp S16-S50, issn 1464-4258Conference Paper